Semiconductor measurement technology

Materias

• Semiconductors
• Wafer-scale integration
• Semiconductor wafers
• Integrated circuits

Ediciones (2)

• Semiconductor measurement technology (1993)

  U.S. Dept. of Commerce, National Institute of Standards and Technology · inglés

• Semiconductor measurement technology (1993)

  U.S. Dept. of Commerce, National Institute of Standards and Technology · inglés

Más obras de W. Murray Bullis

Semiconductor characterization

EEvolution of silicon materials characterization

Evolution of silicon materials characterization

1993

MMeasurement methods for the semiconductor device industry -

Measurement methods for the semiconductor device industry - a summary of NBS activity