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Número de Cutter-Sanborn y catálogo bibliográfico en español, con millones de obras, ediciones y autores.

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Datos bibliográficos de Open Library (Internet Archive). Tabla Cutter-Sanborn de tres cifras.

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W. Murray Bullis

Número de Cutter-SanbornB937Entrada de tabla «Bulli»

W. Murray Bullis

1930 · 7 obras en el catálogo

Obras

Tapa de Semiconductor characterization

Semiconductor characterization

EEvolution of silicon materials characterization

Evolution of silicon materials characterization

1993

MMeasurement methods for the semiconductor device industry -

Measurement methods for the semiconductor device industry - a summary of NBS activity

1969

MMeasurement of carrier lifetime in semiconductors

Measurement of carrier lifetime in semiconductors

1968

MMetrology for submicrometer devices and circuits

Metrology for submicrometer devices and circuits

1980

SSemiconductor measurement technology

Semiconductor measurement technology

1993

SSurvey of optical characterization methods for materials, pr

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

1995

W. Murray Bullis (1930–) — obras y número de Cutter | Cutter Number