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Evolution of silicon materials characterization

EEvolution of silicon materials characterization

Número de Cutter-SanbornB937eEntrada «Bulli» → 937 · marca de obra “e”

Evolution of silicon materials characterization

de W. Murray Bullis · Publicada por primera vez en 1993

Materias

Silicon
Materials
Semiconductor wafers
Electronics
Testing
Standards

Ediciones (1)

Evolution of silicon materials characterization (1993)
U.S. Dept. of Commerce, National Institute of Standards and Technology · inglés

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Tapa de Semiconductor characterization

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MMeasurement methods for the semiconductor device industry -

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Measurement of carrier lifetime in semiconductors

Evolution of silicon materials characterization — W. Murray Bullis | Cutter Number

1968

MMetrology for submicrometer devices and circuits

Metrology for submicrometer devices and circuits

1980

SSemiconductor measurement technology

Semiconductor measurement technology

1993

SSurvey of optical characterization methods for materials, pr

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

1995

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