Metrology for submicrometer devices and circuits

Materias

• Semiconductors
• Testing
• Integrated circuits
• Measurement
• Microelectronics

Ediciones (1)

• Metrology for submicrometer devices and circuits (1980)

  U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off. · inglés

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