Optical Micro and Nanometrology in Microsystems Technology

Materias

• Photonics
• Congresses
• Metrology
• Microscopy
• Optical measurements
• Industrial applications

Ediciones (2)

• Optical micro- and nanometrology in microsystems technology (2006)

  SPIE · inglés

• Optical Micro and Nanometrology in Microsystems Technology (2006)

  Society of Photo Optical · inglés · ISBN 9780819462442

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