Defect-oriented testing for nano-metric CMOS VLSI circuits

Thermal and Power Management of Integrated Circuits

Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)

Thermal and Power Management of Integrated Circuits

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Defect oriented testing for CMOS analog and digital circuits

1998

2000 IEEE International Workshop on Defect Based Testing