Defect oriented testing for CMOS analog and digital circuitsde Manoj Sachdev · Publicada por primera vez en 1998MateriasComplementary Metal oxide semiconductorsDefectsDigital integrated circuitsLinear integrated circuitsMetal oxide semiconductors, ComplementaryTestingTestenCMOS-SchaltungEdiciones (2)Defect Oriented Testing for CMOS Analog and Digital Circuits (2013)
CCMOS SRAM Circuit Design and Parametric Test in Nano-Scaled CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
