cutternumberG216c

Calculadora Explorar ¿Qué es el Cutter?

Buscar en el catálogo

Cargando…

cutternumber.com.ar

Número de Cutter-Sanborn y catálogo bibliográfico en español, con millones de obras, ediciones y autores.

Calculadora Cutter Guía de catalogación Explorar el catálogo

Datos bibliográficos de Open Library (Internet Archive). Tabla Cutter-Sanborn de tres cifras.

Inicio
Explorar
Characterization and metrology for ULSI technology

CCharacterization and metrology for ULSI technology

Número de Cutter-SanbornS461cEntrada «Seil» → 461 · marca de obra “c”

Characterization and metrology for ULSI technology

de David G. Seiler

Materias

Congresses
Integrated circuits
Ultra large scale integration
Software

Ediciones (2)

Characterization and Metrology for Ulsi Technology (1998)
American Institute of Physics · inglés · ISBN 9781563967535
Characterization and metrology for ULSI technology (1998)
American Institute of Physics · inglés

Más obras de David G. Seiler

Characterization and metrology for ULSI technology — David G. Seiler | Cutter Number

Tapa de Semiconductors and semimetals

Semiconductors and semimetals

NNarrow-gap semiconductors and related materials

Narrow-gap semiconductors and related materials

Tapa de Semiconductor characterization

Semiconductor characterization

IImproved characterization and evaluation measurements for Hg

Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites

SSpectroscopy of Semiconductors

Spectroscopy of Semiconductors

MMetrology and Diagnostic Techniques for Nanoelectronics

Metrology and Diagnostic Techniques for Nanoelectronics

Ver todas las obras de David G. Seiler →