David G. Seiler
· 9 obras en el catálogo
Obras

Semiconductors and semimetals
Characterization and metrology for ULSI technology
Narrow-gap semiconductors and related materials

Semiconductor characterization
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites
Spectroscopy of Semiconductors
Metrology and Diagnostic Techniques for Nanoelectronics

Life on Hold
