Advanced Scanning Electron Microscopy and X-Ray Microanalysis
de Patrick Echlin, C.E. Fiori, Joseph Goldstein
Ediciones (2)
- Advanced Scanning Electron Microscopy and X-Ray Microanalysis (2013)
Springer · ISBN 9781475790283
- Advanced Scanning Electron Microscopy and X-Ray Microanalysis (2013)
Springer · inglés · ISBN 9781475790290
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