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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Name: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 9781475790283

Autor	Patrick Echlin, C.E. Fiori, Joseph Goldstein
Editorial	Springer
Fecha de publicación	Jul 15, 2013
Páginas	476

Advanced Scanning Electron Microscopy and X-Ray Microanalysis (2013) — ISBN 9781475790283 | Cutter Number