Scanning electron microscopy, X-ray microanalysis, and analytical electron microscopy
de Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy
de Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy
Springer · inglés · ISBN 9780306435911
Plenum Press · inglés
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