Trace-Based Post-Silicon Validation for VLSI Circuits

Materias

• Integrated circuits, very large scale integration

Ediciones (2)

• Trace-Based Post-Silicon Validation for VLSI Circuits (2016)

  Springer · ISBN 9783319375946

• Trace-Based Post-Silicon Validation for VLSI Circuits (2013)

  Springer · ISBN 9783319005348

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