Integrated Optics and Microstructures IIIde Massood Tabib-AzarMateriasIntegrated opticsSemiconductorsNanotechnologyCongressesEdiciones (1)Integrated optics and microstructures III (1996)SPIE · inglésMás obras de Massood Tabib-AzarIntegrated optics and microstructuresIntegrated optics and microstructuresIntegrated optics and microstructures II
EEffect of crystal defects on minority carrier diffusion lengEffect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method1997
