Integrated optics and microstructuresde Massood Tabib-AzarMateriasSemiconductorsMachiningCongressesNanotechnologyIntegrated opticsEdiciones Más obras de Massood Tabib-AzarIntegrated optics and microstructuresIntegrated optics and microstructures IIIntegrated Optics and Microstructures III
EEffect of crystal defects on minority carrier diffusion lengEffect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method1997
