Integrated optics and microstructuresde Massood Tabib-AzarMateriasSemiconductorsMachiningCongressesNanotechnologyIntegrated opticsIntegrated softwareElectron opticsMicrostructureOpticsOptical instrumentsDesign and constructionEdiciones (1)Integrated optics and microstructures (1992)The Society · inglésMás obras de Massood Tabib-AzarIntegrated optics and microstructuresIntegrated optics and microstructures IIIntegrated Optics and Microstructures III
EEffect of crystal defects on minority carrier diffusion lengEffect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method1997
