Digital hardware testingde Rochit Rajsuman · Publicada por primera vez en 1992MateriasData processingTestingElectronic digital computersCircuitsVery large scale integrationElectric fault locationIntegrated circuitsFault-tolerant computingEdiciones (1)Digital hardware testing (1992)Artech House · inglésMás obras de Rochit RajsumanBBridging faults and IDDQ testingBridging faults and IDDQ testingIddq testing for CMOS VLSI1995System-on-a-Chip2000