Surface scattering and diffraction for advanced metrologyde Zu-Han Gu, A. A. MaradudinMateriasCongressesMetrologyScattering (Physics)MeasurementSurface roughnessOptical measurementsDiffractive scatteringEdiciones (1)Surface scattering and diffraction for advanced metrology (2001)SPIE · inglés
RReflection, scattering, and diffraction from surfacesReflection, scattering, and diffraction from surfaces
RReflection, scattering, and diffraction from surfaces IIReflection, scattering, and diffraction from surfaces II