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Stress induced phenomena in metallization

Tapa de Stress induced phenomena in metallization

Número de Cutter-SanbornH678sEntrada «Ho» → 678 · marca de obra “s”

Stress induced phenomena in metallization

Materias

Thin film devices
Metallic films
Semiconductors
Electrochemical metallizing
Liquid crystal devices
Congresses
Defects
Electrodiffusion
Acoustic surface wave devices
Aluminum films
Integrated circuits

Ediciones (1)

Stress induced phenomena in metallization (1998)
American Institute of Physics · inglés

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