P. S. Ho
· 11 obras en el catálogo
Obras

Advanced interconnects for ULSI technology

Stress-induced phenomena in metallization

Low dielectric constant materials for IC applications

Electronic packaging materials science VI

Thin films

Stress-induced phenomena in metallization
Stress-induced phenomena in metallization

Materials Reliability Issues in Microelectronics
Thin Films Vol. 54
Diffusion phenomena in thin films and microelectronic materials
