Self-testing VLSI designde V. N. I͡ArmolikMateriasDesignIntegrated circuitsTestingVery large scale integrationEdiciones (1)Self-testing VLSI design (1993)Elsevier · inglésMás obras de V. N. I͡ArmolikFault diagnosis of digital circuitsGeneration and application of pseudorandom sequences for random testingGGenerirovanie i primenenie psevdosluchaĭnykh signalov v sistGenerirovanie i primenenie psevdosluchaĭnykh signalov v sistemakh ispytaniĭ i kontroli͡a
GGenerirovanie i primenenie psevdosluchaĭnykh signalov v sistGenerirovanie i primenenie psevdosluchaĭnykh signalov v sistemakh ispytaniĭ i kontroli͡a
