Failure analysis of integrated circuitsde Lawrence C. WagnerMateriasFailuresSemiconductorsReliabilityTestingIntegrated circuitsElectric circuitsEdiciones (1)Failure analysis of integrated circuits (1999)Kluwer Academic Publishers · inglésMás obras de Lawrence C. WagnerFailure Analysis of Integrated CircuitsFailure Analysis of Integrated CircuitsVer todas las obras de Lawrence C. Wagner →