Electron Microscopy and Analysis Third Edition
de Peter J. Goodhew, John Humphreys, Richard Beanland
Ediciones (1)
- Electron Microscopy and Analysis Third Edition (2000)
Taylor & Francis Group · inglés · ISBN 9781420017250
de Peter J. Goodhew, John Humphreys, Richard Beanland
Taylor & Francis Group · inglés · ISBN 9781420017250
