cutternumberG216c

Calculadora Explorar ¿Qué es el Cutter?

Buscar en el catálogo

Cargando…

cutternumber.com.ar

Número de Cutter-Sanborn y catálogo bibliográfico en español, con millones de obras, ediciones y autores.

Calculadora Cutter Guía de catalogación Explorar el catálogo

Datos bibliográficos de Open Library (Internet Archive). Tabla Cutter-Sanborn de tres cifras.

Inicio
Explorar
Electromigration and Stress Voiding

EElectromigration and Stress Voiding

Número de Cutter-SanbornM972eEntrada «Mur» → 972 · marca de obra “e”

Electromigration and Stress Voiding

de Shyam P. Murarka

Ediciones (1)

Electromigration and Stress Voiding (2008)
John Wiley & Sons Inc · inglés · ISBN 9780471040583

Más obras de Shyam P. Murarka

Tapa de Copper-fundamental mechanisms for microelectronic applications

Copper-fundamental mechanisms for microelectronic applications

2000

Tapa de Advanced metallizations in microelectronics

Advanced metallizations in microelectronics

Tapa de Advanced metallization and processing for semiconductor devices and circuits--II

Advanced metallization and processing for semiconductor devices and circuits--II

Electromigration and Stress Voiding — Shyam P. Murarka | Cutter Number

AAdvanced Metallization and Processing for Semiconductor Devi

Advanced Metallization and Processing for Semiconductor Devices and Circuits - III

SSilicides for VLSI Applications

Silicides for VLSI Applications

Tapa de Advanced Metallization for Devices and Circuits - Science, Technology, and Manufacturability

Advanced Metallization for Devices and Circuits - Science, Technology, and Manufacturability

Ver todas las obras de Shyam P. Murarka →