Automatic inspection and novel instrumentationde Anthony T. S. HoMateriasEngineering inspectionIndustrial applicationsAutomationOptical methodsQuality controlCongressesImaging systemsOptical detectorsEdiciones (1)Automatic inspection and novel instrumentation (1997)SPIE · inglés
HHandbook of Digital Forensics of Multimedia Data and DevicesHandbook of Digital Forensics of Multimedia Data and Devices, Enhanced E-Book
HHandbook of Digital Forensics of Multimedia Data and DevicesHandbook of Digital Forensics of Multimedia Data and Devices
