Nanostructure science, metrology, and technology
5-7 September 2001, Gaithersburg, USA
Edición de la obra Nanostructure science, metrology, and technology
| Autor | Michael T. Postek |
|---|---|
| Editorial | SPIE-the International Society for Optical Engineering |
| Fecha de publicación | 2002 |
| Lugar | Bellingham, Wash |
| Idioma | inglés |
| Páginas | 278 |
| ISBN-10 | 0819443476 |
| OCLC | 50514238 |
| LCCN | 2003268907 |
| Serie | SPIE proceedings series, · v. 4608 · Proceedings of SPIE--the International Society for Optical Engineering ; |