Modern optical characterization techniques for semiconductors and semiconductor devices
Edición de la obra Modern optical characterization techniques for semiconductors and semiconductor devices
| Autor | Fred H. Pollak, Jin-Joo Song |
|---|---|
| Editorial | SPIE--the International Society for Optical Engineering |
| Fecha de publicación | 1987 |
| Lugar | Bellingham, Wash., USA |
| Idioma |