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Número de Cutter-Sanborn y catálogo bibliográfico en español, con millones de obras, ediciones y autores.

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Fred H. Pollak

Número de Cutter-SanbornP771Entrada de tabla «Poll»

Fred H. Pollak

· 8 obras en el catálogo

Obras

Tapa de Surface and interface analysis of microelectronic materials processing and growth

Surface and interface analysis of microelectronic materials processing and growth

Tapa de Spectroscopic charcterization techniques for semiconductor technology

Spectroscopic charcterization techniques for semiconductor technology

Tapa de Layered structures

Layered structures

Tapa de Spectroscopic characterization techniques for semiconductor technology III

Spectroscopic characterization techniques for semiconductor technology III

Tapa de Spectroscopic characterization techniques for semiconductor technology II

Spectroscopic characterization techniques for semiconductor technology II

Tapa de Modern optical characterization techniques for semiconductors and semiconductor devices

Modern optical characterization techniques for semiconductors and semiconductor devices

Tapa de Diagnostic Techniques for Semiconductor Materials Processing II Vol. 406

Diagnostic Techniques for Semiconductor Materials Processing II Vol. 406

PPhotoreflectance for in-situ characterization of MOCVD growt

Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions

Fred H. Pollak — obras y número de Cutter | Cutter Number