Número de Cutter-SanbornL196iEntrada «Lall» → 196 · marca de obra “i”

Influence of Temperature on Microelectronics and System Reliability

Name: Influence of Temperature on Microelectronics and System Reliability
ISBN: 9780367400972

Autor	Pradeep Lall, Michael G. Pecht, Edward B. Hakim
Editorial	Taylor & Francis Group
Fecha de publicación	2019
Idioma	inglés
ISBN-13	9780367400972
Número de Cutter	`L196i`

Influence of Temperature on Microelectronics and System Reliability (2019) — ISBN 97803674 | Cutter Number