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Influence of Temperature on Microelectronics and System Reliability

Name: Influence of Temperature on Microelectronics and System Reliability
ISBN: 9780429600074

A Physics of Failure Approach

Fecha de publicación
Autor	Pradeep Lall, Michael G. Pecht, Edward B. Hakim
Editorial	Taylor & Francis Group

Influence of Temperature on Microelectronics and System Reliability (2020) — ISBN 97804296 | Cutter Number