Influence of temperature on microelectronics and system reliability
Edición de la obra Influence of temperature on microelectronics and system reliability
| Autor | Pradeep Lall |
|---|---|
| Editorial | CRC Press |
| Fecha de publicación | 1997 |
| Lugar | Boca Raton |
| Idioma | inglés |
| Páginas | 307 |
| ISBN-10 | 0849394503 |
| LCCN | 96039038 |
| Serie | The electronic packaging series |
| Número de Cutter | L196i |