Diagnostic Techniques for Semiconductor Materials Processing II
Symposium Held November 27-30, 1995, Boston, Massachusetts, U.S.A (Materials Research Society Symposium Proceedings)
Edición de la obra Diagnostic Techniques for Semiconductor Materials Processing II Vol. 406
| Autor | Orest J. Glembocki, Fred H. Pollak |
|---|---|
| Editorial | Materials Research Society |
| Fecha de publicación | April 1996 |
| Idioma | inglés |
| Páginas | 585 |
| Formato | Hardcover |
| ISBN-13 | 9781558993099 |
| ISBN-10 | 1558993096 |
| OCLC | 34191076 |