Transmission Electron Microscopy and Diffractometry of Materials 3rd Editionde Brent Fultz, James M. HoweMateriasMaterials, microscopyElectron microscopesX-rays, diffractionEdiciones (1)Transmission Electron Microscopy and Diffractometry of Materials 3rd Edition (2008)Springer · ISBN 9783540738862Más obras de Brent Fultz