Transient Electromagnetic-Thermal Nondestructive Testing
de Yunze He, Bin Gao, Ali Sophian, Ruizhen Yang
Materias
Ediciones (2)
- Transient Electromagnetic-Thermal Nondestructive Testing (2017)
Elsevier Science & Technology Books · inglés · ISBN 9780128128367
- Transient Electromagnetic-Thermal Nondestructive Testing (2017)
Elsevier Science & Technology Books · inglés · ISBN 9780128127872