Structural, Syntactic, and Statistical Pattern Recognition
de Andrea Torsello, Adam Krzyzak, Nicola Nobile, Ching Y. Suen
Ediciones (2)
- Structural, Syntactic, and Statistical Pattern Recognition (2025)
Springer · inglés · ISBN 9783031805066
- Structural, Syntactic, and Statistical Pattern Recognition (2023)
Springer International Publishing AG · inglés · ISBN 9783031230271
