Statistical analysis with ArcView GISde Jay Lee, David W. S. WongMateriasStatisticsArcViewGeographic information systemsTECHNOLOGY & ENGINEERINGRemote Sensing & Geographic Information SystemsEdiciones (1)Statistical Analysis with ArcView GIS (r) (2000)Wiley · inglés · ISBN 9780471348740Más obras de Jay Lee