Proceedings
de IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1999 Albuquerque, N.M.), IEEE Computer Society, Institute of Electrical and Electronics Engineers · Publicada por primera vez en 1999
de IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1999 Albuquerque, N.M.), IEEE Computer Society, Institute of Electrical and Electronics Engineers · Publicada por primera vez en 1999
IEEE Computer Society Press · inglés
Institute of Electrical & Electronics Enginee · inglés · ISBN 9780769503257