Machine vision applications, architectures, and systems integration IIde Bruce G. Batchelor, Frederick M. WaltzMateriasComputer visionCongressesIndustrial applicationsEdiciones (1)Machine vision applications, architectures, and systems integration II (1993)SPIE · inglésMás obras de Bruce G. BatchelorTwo- and three-dimensional vision systems for inspection, control, and metrology
MMachine vision systems for inspection and metrology VIIMachine vision systems for inspection and metrology VII
