Interferometry XIIde Wolfgang Osten, Erich NovakMateriasMensurationCongressesIndustrial applicationsInterferometryMeasurementEdiciones (1)Interferometry XII (2004)SPIE · inglésMás obras de Wolfgang OstenOOptical measurement systems for industrial inspection VIIOptical measurement systems for industrial inspection VIIOptical inspection of microsystemsFringe 2009
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