From artefacts to atomsde T. J. QuinnMateriasMetric systemInternational Bureau of Weights and MeasuresEdiciones (1)From artefacts to atoms (2011)Oxford University Press · inglés · ISBN 9780195307863Más obras de T. J. QuinnRRecent Advances in Metrology and Fundamental ConstantsRecent Advances in Metrology and Fundamental ConstantsMMetrology at the Frontiers of Physics and TechnologyMetrology at the Frontiers of Physics and TechnologyHHaakon, the Drogon PrinceHaakon, the Drogon Prince
RRecent Advances in Metrology and Fundamental ConstantsRecent Advances in Metrology and Fundamental Constants
MMetrology at the Frontiers of Physics and TechnologyMetrology at the Frontiers of Physics and Technology
