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Defects in HIgh-k Gate Dielectric Stacks

Tapa de Defects in HIgh-k Gate Dielectric Stacks

Número de Cutter-SanbornG982dEntrada «Gus» → 982 · marca de obra “d”

Defects in HIgh-k Gate Dielectric Stacks

Nano-Electronic Semiconductor Devices

de Evgeni Gusev

Materias

Dielectrics
Semiconductors

Ediciones (1)

Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (2006)
Springer · inglés · ISBN 9781402043666

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