X rays in materials analysis II
novel applications and recent developments : 25-26 July 1991, San Diego, California
Edición de la obra X rays in materials analysis II
| Autor | Dennis M. Mills |
|---|---|
| Editorial | SPIE |
| Fecha de publicación | 1991 |
| Lugar | Bellingham, Wash |
| Idioma | inglés |
| Páginas | 172 |
| ISBN-10 | 0819406783 |
| OCLC | 25915082 |
| LCCN | 91062628 |
| Serie | Proceedings / SPIE--the International Society for Optical Engineering ; · v. 1550 · Proceedings of SPIE--the International Society for Optical Engineering ; |