X-ray multilayers for diffractometers, monochromators, and spectrometers
17-19 August 1988, San Diego, California
Edición de la obra X-ray multilayers for diffractometers, monochromators, and spectrometers
| Autor | SPIE |
|---|---|
| Editorial | The Society |
| Fecha de publicación | 1988 |
| Lugar | Bellingham, Wash., USA |
| Idioma | inglés |
| Páginas | 271 |
| ISBN-10 | 081940019X |
| OCLC | 19450764 |
| LCCN | 88062305 |
| Serie | Proceedings / SPIE--the International Society for Optical Engineering ; · v. 984 · Proceedings of SPIE--the International Society for Optical Engineering ; |