X-Ray Microscopy II
Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
Edición de la obra X-Ray Microscopy II
| Autor | David Sayre |
|---|---|
| Editorial | Springer Berlin Heidelberg, Imprint: Springer |
| Fecha de publicación | 1988 |
| Lugar | Berlin, Heidelberg |
| Idioma | inglés |
| Páginas | 455 |
| Formato | [electronic resource] : |
| ISBN-13 | 9783540392460 |
| ISBN-10 | 3540392467 |
| OCLC | 859584370 |
| Serie | Springer Series in Optical Sciences -- 56 · Springer Series in Optical Sciences -- 56. |