VLSI Design and Test
22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Edición de la obra VLSI Design and Test
| Autor | S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani |
|---|---|
| Editorial | Springer |
| Fecha de publicación | Jan 28, 2019 |
| Páginas | 742 |
| Formato | paperback |
| ISBN-13 | 9789811359514 |
| ISBN-10 | 9811359512 |
| Número de Cutter | R161v |