VLSI Design and Test
21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Edición de la obra VLSI Design and Test
| Autor | Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh |
|---|---|
| Editorial | Springer |
| Fecha de publicación | Jan 26, 2018 |
| Páginas | 815 |
| Formato | paperback |
| ISBN-13 | 9789811074691 |
| ISBN-10 | 9811074690 |
| Número de Cutter | K21v |