VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Edición de la obra VLSI Design and Test
| Autor | Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma |
|---|---|
| Editorial | Springer |
| Fecha de publicación | Aug 17, 2019 |
| Páginas | 775 |
| Formato | paperback |
| ISBN-13 | 9789813297661 |
| ISBN-10 |