Testing, reliability, and application of micro- and nano-material systems
3-5 March, 2003, San Diego, California, USA
Edición de la obra Testing, reliability, and application of micro- and nano-material systems
| Autor | Norbert Meyendorf, George Y. Baaklini |
|---|---|
| Editorial | SPIE |
| Fecha de publicación | 2003 |
| Lugar | Bellingham, Wash |
| Idioma | inglés |
| Páginas | 276 |
| ISBN-10 | 0819448508 |
| OCLC | 52852709 |
| LCCN | 2004296961 |
| Serie |