Surface charaterization by LEED, RHEED, REM, STM, and holography
proceedings of the U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography, Kona, Hawaii, 16-19 March 1993
Edición de la obra Surface charaterization by LEED, RHEED, REM, STM, and holography
| Autor | U.S.-Japan Seminar on Surface Characerization by Electron Diffraction, Reflection Electron Microscopy, and Holography (1993 Kona, Hawaii) |
|---|---|
| Editorial | North-Holland |
| Fecha de publicación | 1993 |
| Lugar | Amsterdam |
| Idioma | inglés |
| Serie | Surface science -- vol.298 (2-3) |
| Número de Cutter | S961 |