Surface characterization and testing II
10-11 August 1989, San Diego, California
Edición de la obra Surface characterization and testing II
| Autor | John E. Greivenkamp, Matt Young |
|---|---|
| Editorial | SPIE--the International Society for Optical Engineering |
| Fecha de publicación | 1989 |
| Lugar | Bellingham, Wash., USA |
| Idioma | inglés |
| Páginas | 271 |
| ISBN-10 | 0819402001 |
| OCLC | 20989391 |
| LCCN | 89043274 |
| Serie | Proceedings / SPIE--the International Society for Optical Engineering ; · v. 1164 · Proceedings of SPIE-the International Society for Optical Engineering ; |